Libri di Toh-Ming Lu
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Dielectric Breakdown in Gigascale Electronics: Time Dependent Failure Mechanisms
Springer International Publishing AG, 2016Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane68,70 € -
RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis
Springer-Verlag New York Inc., 2016Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane135,70 € -
Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability
Springer-Verlag New York Inc., 2016Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane137,00 € -
RHEED Transmission Mode and Pole Figures: Thin Film and Nanostructure Texture Analysis
Springer-Verlag New York Inc., 2013Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane131,20 € -
Metal-Dielectric Interfaces in Gigascale Electronics: Thermal and Electrical Stability
Springer-Verlag New York Inc., 2011Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane194,50 € -
Pulsed and Pulsed Bias Sputtering: Principles and Applications
Springer-Verlag New York Inc., 2014Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane137,90 € -
Chemical Vapor Deposition Polymerization: The Growth and Properties of Parylene Thin Films
Springer-Verlag New York Inc., 2010Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane138,20 € -
Evolution of Thin Film Morphology: Modeling and Simulations
Springer-Verlag New York Inc., 2010Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane212,60 € -
Chemical Vapor Deposition Polymerization: The Growth and Properties of Parylene Thin Films
Springer-Verlag New York Inc., 2003Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane133,20 € -
Pulsed and Pulsed Bias Sputtering: Principles and Applications
132,70 € -
Evolution of Thin Film Morphology: Modeling and Simulations
Springer-Verlag New York Inc., 2007Libri in Inglese | Science, Computer & TechnologyDisp. in 2 settimane207,70 €
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